Please use this identifier to cite or link to this item:
http://repositsc.nuczu.edu.ua/handle/123456789/2489
Title: | Crystal Structure of Nanoscale Tin Dioxide Films Produced by Magnetron Sputtering |
Authors: | Пирогов, Олександр Вікторович Sokol, Yevgen Ivanovych Klochko, Natalya Petrovna Novikov, Vitaliy Aleksandrovich Khrypunov, Gennadiy Semenovych Klepikova, Katerina Sergeevna |
Keywords: | tin dioxide crystal structure gas sensor electron microscopy |
Issue Date: | Apr-2014 |
Publisher: | National Technical University of Ukraine "Kyiv Polytechnic Institute" |
Citation: | Conference proceeding 34th International Scientific Conference on Electronics and nanotechnology (ELNANO) |
Abstract: | Investigation of direct current magnetron sputtering parameters effects on the crystal structure of gas sensitive tin dioxide films has revealed that the change in the substrate temperature and in the film thickness leads to the transition from the condensation of metastable conglomerates of amorphous globules to the ≈15 nm SnO2 crystallites with three-dimensional shape and well-defined edges. The dependence of the SnO2 structure from the working Ar-O2 gas mixtures and from their humidity evidences the significant role of the adsorption in the kinetics of the magnetron sputtering of tin dioxide. Due to the adsorption the morphological and dimensional characteristics of the tin dioxide films demonstrate the anomalous stability of the amorphous globules with their enhanced specific surface energy and the stabilization of the amorphous state, selectively retained even after the SnO2 film reach in general the critical thickness of the crystallization. |
URI: | http://repositsc.nuczu.edu.ua/handle/123456789/2489 |
ISBN: | 978-1-4799-4582-5 |
Appears in Collections: | Кафедра пожежної профілактики в населених пунктах |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
ELNANO-2014_моя статья.pdf | Основная статья | 1,14 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.